Spectroscopy Ellipsometer (SE),
Thickness, Refractive Index
World-class instrument, expertise
Fast Measurements
*Thickness *Refractive Index *Optical Reverse Engineering
- Fast, Expertise service
- World-class equipment
- Nearly all clients like our report and service
- Unique Optical Reverse Engineering
Fast, Quality, Competitive Price
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Thin-film thickness 1nm~ 1um, Unique accurate.
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Wide Spectra Optical constant, Refractive Index n, k
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Band Gap
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Density profile along the thin film cross-section
Unique Optical Reverse Engineering
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Unique measurement methods
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Plus Software simulation: Optilayer and Woollam W-VASE
Ellipsometry (SE) + Transmittance (T): Thickness accuracy much improved
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SE+T provides much more accurate thickness, n,k properties than those measured by SE alone
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Additional information (such as gradience) could be obtained
Thickness accuracy
much improved
SE + T + Res (sheet resistance)
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SE+T+Res provide more accurate thickness, n,k
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Additional information that could be obtained accurately,
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Gradience
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Carrier density
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Carrier mobility
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