Unique Metrology

Thin Film Coating & Characterization
with world-class metrology available on-site
 Unique optical reverse engineering 

1. Spectroscopic Ellipsometry

Spectral ellipsometry measures the characteristics like thickness, refractive index, extinction coefficient of transparent films, making it essential to the development of thin film stacks without having to fabricate cumbersome test structures. Ellipsometry is a complex technique that yields rich data when combined with powerful modelling by the senior expert in the field.

Applications: Optics (laser, coatings, electrochromic and photochromic coatings), displays, anti-reflective and high-reflection coatings, semiconductors, photosensitive materials

Measurements: From the raw collected data, advanced modeling allows to extract

  • Generalized Ellipsometry (Anisotropy, Retardance, Birefringence)

  • Optical constants: refractive index (n), extinction coefficient (k), and reflectance (R) and transmittance (T) intensity

  • Film thickness 1nm-1um (~Å accuracy)

  • Electron mobility and density along the cross section

  • Band gap
     

Instrument: J.A. Woollam VASE (variable angle spectroscopic ellipsometry).  J.A.Woollam is the reference manufacturer of spectral ellipsometers, and the VASE model is currently the gold standard in the field: versatile and accurate. This instrument combines high accuracy and precision with a wide spectral range.  

2. UV - Visible - Near Infrared Spectroscopy

Ultraviolet-visible-near infrared spectroscopy is used for reflectance (R) and transmittance (T) measurements, across the ultra-violet, visible and near infrared spectrum. These are particularly useful to the solar, displays and optical systems and coatings development: effectiveness of anti-reflective coatings for solar cells, uniformity of system response across the visible spectrum for displays can typically be characterized by spectrophotometry.

Applications: Optics (components, coatings including anti-reflective and high-reflection coatings), displays, solar, coatings, semiconductors characterization.

Measurements

  • Transmittance (T) and reflectance (R) and absorption (A)

  • Solar Transmittance (Tsolar) and solar reflectance (Rsolar)

  • Thermal properties of single glass, laminated glass and Insulated Glass unit, Solar Heat Gain Coefficient (SHGC), Light to Solar Gain ratio (LSG)

  • From the raw collected data, combined with ellipsometry allows powerful tool for optical reverse engineering to extract layer thickness and layer optical constants (n,k), electron mobility and density.

Instrument: Shimadzu Solid Spec 3700 DUV.  This top of the line instrument allows to analyze large samples up to 200mm in diameter, reducing sample preparation. The addition of the DUV option means the high energy, deep UV spectrum is accessible, limited only by the absorption of air. Three detectors ensure high sensitivity across the whole UV-visible-NIR spectrum.

3. Four-point probe

The four-point probe can measure the sheet resistance of applied coatings such as conductive paints, EMI coatings, ITO on glass, etc. Applications for the instruments include measuring the sheet resistance of conductive paint on Low Observable Aircraft to verify uniform paint thickness, measuring the sheet resistance of EMI paint applied to computer chassis, measuring the sheet resistance of ITO on glass used in flat panel displays, and measuring many other types of conductive coatings.

Applications: Thin film electrical sheet resistance characterazation

Measurements: 

  • Thin film sheet resistance

  • SRM-232-100

    •  Range: 0.00 to 95.00 ohms/square.

    •  Displayed as: # # # . # #

    •  Resolution: 0.04 ohms/square

    •  Accuracy 0.07 ohms/square @ 10 ohms/sq.

  • SRM-232-1000

    •  Range: 0.00 to 999.99 ohms/square.

    •  Displayed as: # # # . # #

    •  Resolution: 0.4 ohms/sq.

    •  Accuracy: 0.7 ohms/sq. @ 100 ohm/sq​​

Instrument: SRM-232 Sheet Resistance Meter with Four Point Probe

4. Additional equipment from a partner

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